Atomic Force Microscope
Thông số cơ bản
| Tiêu chuẩn: | Nanoscale imaging and surface characterization |
| Ứng dụng: | Material science, life science, nanotechnology, semiconductor research, surface analysis |
| Công nghệ phân tích: | Atomic Force Microscopy, Scanning Probe Microscopy |
| Nhà cung cấp: | NanoMagnetics Instruments |
| Model: | hpAFM |
- hpAFM is an advanced Atomic Force Microscope from NanoMagnetics Instruments.
- It features an alignment-free design, closed-loop flexure scanner, and decoupled Z scanner.
- The system supports nanoscale imaging, surface analysis, and advanced AFM measurements in air or liquid environments.
Công Ty TNHH Beta Technology chịu trách nhiệm phân phối chính hãng, mọi thắc mắc xin liên hệ số điện thoại 0903.042.747 hoặc email sales@betatechco.com để được hỗ trợ!
Atomic Force Microscope
hpAFM Atomic Force Microscope
hpAFM is an advanced Atomic Force Microscope (AFM).
It brings a new level of performance, functionality, design and capability.
The system is designed to minimize the time needed to get the best results.
Whether users work in liquid or in air conditions, hpAFM can support different application needs.
It is suitable for users from material science to life science.
The system offers features such as alignment-free design, closed loop flexure scanner, decoupled Z scanner, 10 MP video microscope and flexible operating modes.
High Performance Atomic Force Microscopy
hpAFM is designed for high performance atomic force microscopy.
It provides advanced performance, functionality, design and capability.
It also helps reduce the time required to obtain the best results.
The system can be used in liquid conditions.
It can also be used in air conditions.
This makes hpAFM suitable for a wide range of users.
hpAFM is suitable for material science.
It is also suitable for life science applications.
The system supports flexible operating modes for different measurement requirements.
Alignment-Free Design| Atomic Force Microscope
A common problem in AFM operation is cantilever mounting.
After cantilever exchange, the laser and photodiode often need to be repositioned.
The laser must be realigned to the cantilever.
In some cases, the sample must also be relocated.
hpAFM offers an alignment-free system to overcome this problem.
Each cantilever mounted to hpAFM can be aligned automatically and precisely.
This applies to operation in air.
It also applies to operation in liquid.
The system allows experiments to continue without laser and photodiode realignments.
All cantilevers are equipped with alignment grooves.
They can also be suitable for alignment-series use.
These cantilevers will be exactly aligned when mounted.
All major cantilever manufacturers have these types of cantilevers for different modes.
Closed Loop Flexure Scanner_Atomic Force Microscope
hpAFM uses a flexure-based XY scanner.
The scanner uses an optical sensor to monitor the stage position in real time.
These readings are fed back to the controller.
This feedback provides error correction for the scan.
Closed-loop control ensures that the piezo scanner reaches the desired commanded position.
It also provides fast and accurate positioning.
Minimal piezo drift is very important for AFM scanning.
The closed loop flexure scanner helps support stable AFM measurements.
Decoupled Z Scanner
One commonly used AFM scanner configuration is the tube scanner.
This scanner is widely used because it is easy to fabricate.
However, it also has some disadvantages.
Due to their geometry, tube scanners have non-linearity.
This is especially seen as bowing when using the full range of the scanner.
hpAFM uses decoupled XY and Z scanners to reduce this issue.
In hpAFM, the XY scanner is placed under the sample.
The Z scanner is placed in the head.
This design helps reduce cross-talk between the scanners.
Optical Microscope
hpAFM has a high-quality optical microscope.
The optical microscope has 700 nm optical resolution.
It also has software-controlled, motorized 5X optical zoom and focus.
The system includes an 8 MP digital camera.
This allows users to see the sample from the top.
It also helps users move to a specific area on the sample surface.
The same observation quality is available in air.
It is also available in liquid conditions.
Operating Modes_Atomic Force Microscope
- The microscope can be operated in the following modes:
- Contact Mode AFM
- Lateral Force Microscope (LFM)
- Dynamic Mode AFM & Phase Imaging
- Non-contact Mode AFM with digital PLL
- Liquid AFM
- Magnetic Force Microscope (MFM)
- Electrostatic Force Microscope (EFM)
- Scanning Tunnelling Microscopy (STM)
- Piezo Response Force Microscopy (PRFM)
- Conductive AFM (CAFM) / Scanning Spreading Resistance Microscopy (SSRM)
- AFM Lithography (Scratching)
- Force Modulation Mode
- Kelvin Probe Force Microscopy (KPFM)
- Nano Mechanical Imaging (NMI)
- Electro Chemical AFM (EC-AFM)
- Nanoindentation
- Advanced PFM
Applications and use cases_Atomic Force Microscope-hpAFM
Nanoscale topography and selected mechanical, magnetic, electrical, or liquid-environment measurements, depending on scan head and operating-mode configuration.
Selection and configuration guidance
Provide sample dimensions and roughness, required scan range and resolution, operating environment, measurement modes, liquid or glovebox needs, optical integration, stage travel, and vibration-isolation requirements.
Request a configuration review
Contact NanoMagnetics Instruments with your sample, measurement, environmental, and integration requirements. The technical team will review compatibility, recommend the required options and accessories, and prepare a configuration-specific quotation for hpAFM.
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